A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

Graphene is now the most well-known 2D material. It is comprised of a sheet of covalently bonded carbon atoms arranged in a hexagonal lattice where the thickness has been broken down to a single atom.

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

The NANOscientific Symposium Series (NSS) 2025 has successfully concluded its global program, bringing together the ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...

“Materials scientists designing a polymer-based material for a specific application must analyze how and why all these factors come together to impact the final product. Understanding the structure ...

Scientists have observed atomic magnetic fields, the origin of magnetic forces, for the first time using an innovative Magnetic-field-free Atomic-Resolution STEM they developed. The joint development ...